Library

Improving the 1-Parameter Weibull: A Bayesian Approach

by Aron, Alexander; Guo, Huairui; Mettas, Adamantios; Ogden, Doug

In this paper, a Bayesian model, which is an improved approach for the 1-parameter Weibull, is discussed. Recommendations for establishing variability models for the Weibull shape parameter are presented..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Weibull Analysis, Bayesian

Bayesian Reliability Demonstration Test in a Design for Reliability Process

by Jiang, Mingxiao; Dummer, Daniel J.

This paper illustrates how a Bayesian reliability demonstration test (BRDT) approach can be, and sometimes must be, integrated into a Design for Reliability (DFR) process...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Bayesian Analysis, Demonstration Tests, Design Reliability

Weibayes Testing: What is the Impact if Assumed Beta is Incorrect?

by Nicholls, David B.; Lein, Paul

This paper evaluates Weibayes small sample, zero and sudden death failure test and data analysis techniques in order to mathematically and graphically quantify the risk associated with assuming an incorrect value of the Weibull shape parameter, beta (β)...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Weibull Analysis, Data Analysis, Risk Analysis, Safety and Risk Management

Analysis of Field Performance Using Interval-Censored Incident Data

by Zhao, Ke; Steffey, Duane

We present several case studies to demonstrate how, in practice, such incidents can be treated as interval-censored observations in the time-to-failure analysis...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Weibull Analysis, Statistics, Simulation

Bayesian parameter estimation with prior weighting in ALT model

by Voiculescu, Sorin; Guerin, Fabrice

This paper provides an overview of the application of Bayesian inference to accelerated life testing (ALT) models for the concrete case of estimation by Maximum of Aposteriori (MAP) method in the case of constant stress levels...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Bayesian Analysis, Accelerated Life Testing

Life-Prediction of the CSADT Based on BP Algorithm of ANN

by Zhang, Wei; Jiang, Tongmin; Li, Xiaoyang

In this paper, a new model is developed to predict the life of items in the constant stress accelerated degradation testing (CSADT) based on Back- Propagation (BP) Algorithm of Artificial Neural Network (BPANN)...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, Monte Carlo Analysis, Networks

Worst-Case Prediction using the Arrhenius Model

by Yu, Yangyang (Charlotte); Chen, Felix

We present in this paper an Arrhenius-based method of assessing MTTF as applied to one of our own products...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Reliability Model

Warranty Prediction for Products with Random Stresses and Usages

by Guo, Huairui; Monteforte, Ariai; Mettas, Adamantios; Ogden, Doug

Making accurate warranty predictions is challenging. It becomes even more challenging when products are operated under random stresses and random usages...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Strength-Load, Monte Carlo Analysis, Warranty

Adapted Reliability Prediction by Integrating Mechanical Load Impacts

by Lanza, Gisela; Werner, Patrick, Niggeschmidt, Stephan

This article presents an approach which aims at analyzing and predicting the reliability of machines and their components depending on load that is applied...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Prediction, Weibull Analysis, Data Analysis, FMEA

Product Robust Design via Accelerated Degradation Tests

by Sanches, Luis Mejia; Pan, Rong

In this paper, a methodology is developed for achieving product robust design via ADTs...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, Design Reliability

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