Library

Joint Optimization of Inventory Control and Maintenance Policy

by Li, Wei; Zuo, Ming J.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 12A: Recent Advances in RAM Technology. Moderator: O. Geoffrey Okogbaa, University of South Florida...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Maintainability, Simulation

Incorporating Distribution Parameter Uncertainty in Reliability Calculation

by Venkataraman, Satchi; Strack, William C.; Nagpal, Vinod; Pai, Shantaram S.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 11D: Modeling and Parameter Estimation. Moderator: Hugh Wilson Broome, East Tennessee State University...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,ReliabilityAnalysis/Prediction/Estimation

Improving Storage Subsystem Reliability - a Case Study

by Yang, Jimmy; Harting, John

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 14A: Data Analysis Techniques for Fielded Systems. Moderator: Rick Searle, Air Force Operational Test and Evaluation Center...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Failure Rate, Data Analysis

Improved Reliability Using Accelerated Degradation & Design of Experiments

by Guo, Huairui; Mettas, Adamantios

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 14A: Data Analysis Techniques for Fielded Systems. Moderator: Rick Searle, Air Force Operational Test and Evaluation Center...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Degradation, Design of Experiments

How to Close the Gap Between Hardware and Software Using FMEA

by Bidokhti, Nematollah

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 08B: Software Reliability in Product Development. Moderator: Charles W. Plotkin, Ford Motor Company...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,FMEA, Design Review, Software Reliability, Design Reliability

Forecasting Fleet Warranty Returns Using Modified Reliability Growth Analysis

by Bettini, Gianni; Giansante, Rosalba; Tucci, Mario

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 12B: Effective Analysis of Field Data. Moderator: Harold E. Ascher, H. E. Ascher & Associates...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Warranty, Reliability Growth

Fault Tree Analysis Based on Fuzzy Logic

by He, Li-Ping; Huang, Hong-Zhong; Zuo, Ming J.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 06B: Novel Applications of Fault Tree Analysis to System Reliability Assessment and Prediction. Moderator: Adamantios Mettas, ReliaSoft Corporation...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Fault Tree Analysis

Failure Time Based Reliability Growth in Product Development and Manufacturing

by Jin, Tongdan; Liao, Haitao; Luo, Wen

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 14D: Reliability in Product Design and Maintenence. Moderator: William F. Hagen, Ford Motor Company...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Reliability Growth

Event-Sequence Analysis - It's How You Think!

by Yellman, Ted W.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 07D: Assessing and Managing Risk Using Probalistic Concepts. Moderator: Anthony J. DiVenti, NASA Goddard Spaceflight Center...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Fault Tree Analysis, Markov

Modeling Failure Reduction for Combinational Logic Using Gate Level NMR

by Ness, Drew C.; Hescott, Christian J.; Lilja, David J.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 09A: Accelerated Life Testing. Moderator: Vasiliy V. Krivtsov, Ford Motor Company...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Failure Rate, Reliability Model

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