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Microstructural-Based Physics of Failure Models to Predict Fatigue Reliability

by Tryon, Robert G.; Dey, Animesh; Krishnan, Ganapathi; Zhao, Yaowu

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 12E: Innovations in Failure and Fault Analysis. Moderator: Louis J. Gullo, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Failure Analysis, Risk Analysis

Eliciting Engineering Judgments in Human Reliability Assessment

by Renato, Paulo; da Costa S. Menêzes, Regilda; Droguett, Enrique L.; de Lemos Duarte, Dayse C.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 12D: Risk Assessment: Applications. Moderator: Dr. Thomas F. Hassett, Consultant...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Human Error, Bayesian Analysis

Modelling Imperfect Inspection and Maintenance in Defence Aviation Through Bayesian Analysis of the KIJIMA Type I General Renewal Process (GRP)

by Jacopino, Andrew; Groen, Frank; Mosleh, Ali

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. . Moderator: Edward J. Zampino, NASA Glenn...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Maintainability, Simulation

Terrorist Risk Evaluation Using a Posteriori Fault Trees

by Shooman, Martin L.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11E: Innovations in Hierarchical Analysis and Modeling. Moderator: Mary Rowzee, Daimler Chrysler Corporation...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, Bayesian Analysis

Safety Assessment for Safety-Critical Systems Including Physical Faults and Design Faults

by Yu, Yangyang; Johnson, Barry W.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 13B: Process Improvements and New Techniques in Systems Safety. Moderator: Patrick M. Dallosta, NTVI Federal, Inc....

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Safety, Markov

Safe Crew Launch by Design

by Fragola, Joseph R.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 13A: Designing Safety and Reliability into Space Systems. Moderator: Anthony J. DiVenti, NASA Goddard...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Safety, Risk Assessment

Accident Cause Analysis of Complex Systems Based on Safety Control Functions

by Kohda, Takehisa; Takagi, Yohei

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 13B: Process Improvements and New Techniques in Systems Safety. Moderator: Patrick M. Dallosta, NTVI Federal, Inc....

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,System Reliability, Safety

A Tool for Automatically Translating Dynamic Fault Trees Into Dynamic Bayesian Networks

by Montani, S.; Portinale, L.; Bobbio, A.; Varesio, M.; Codetta-Raiteri, D.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11E: Innovations in Hierarchical Analysis and Modeling. Moderator: Mary Rowzee, Daimler Chrysler Corporation...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Fault Tree Analysis, Bayesian Analysis

A BDD & SEA Based Analysis of Generalized Phased-Mission Reliability

by Chen, Guangyu; Huang, Xizi; Tang, Xiaowo

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11E: Innovations in Hierarchical Analysis and Modeling. Moderator: Mary Rowzee, Daimler Chrysler Corporation...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model

BDD Based Analysis of Parametric Fault Trees

by Codetta-Raiteri, D.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11E: Innovations in Hierarchical Analysis and Modeling. Moderator: Mary Rowzee, Daimler Chrysler Corporation...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Fault Tree Analysis

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