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An Interval Estimate of Mean-Time-to-Failure for a Product With Reciprocal Weibull Degradation Failure Rate

by Polavarapu, Indira; Okogbaa, Geoffrey

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Product Reliability, Weibull Analysis, Degradation

Statistical Model for Estimating the Failure Probability in the Field

by Ion, Roxana

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Bayesian Analysis, Statistics

A Machine Learning Approach to Estimate Frequency, Duration & Availability Indexes in Complex Networks

by Rocco, Claudio M.; Muselli, Marco

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Simulation, Networks

Life Testing Hydraulic Gear Motors

by McLinn, James A.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08A: Component Reliability. Moderator: Kenneth P. LaSala, KPL Systems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Design Reliability, Reliability Model

Memory Yield and Complexity of Built-in Self-Repair

by Wang, Xiaopeng; Mehler, Joel N.; Meyer, Fred J.; Park, Nohpill

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08A: Component Reliability. Moderator: Kenneth P. LaSala, KPL Systems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Electronic Reliability

Reliability Analysis of Disk Drive Failure Mechanisms

by Shah, Sandeep; Elerath, Jon G.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08A: Component Reliability. Moderator: Kenneth P. LaSala, KPL Systems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Failure Analysis

The Value of Field Feedback in Consumer Electronics

by Petkova, Valia T.; Sander, Peter C.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07D: R, M & Q in Design. Moderator: Alan P. Wood, Sun Microsystems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Electronic Reliability, Failure Analysis, System Reliability

Minimize System Reliability Variability Based on Six-Sigma Criteria Considering Component Operational Uncertainties

by Jin, Tongdan; Su, Peter

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07D: R, M & Q in Design. Moderator: Alan P. Wood, Sun Microsystems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model , Electronic Reliability

A Method for Age Modeling of Power System Components Based on Experiences From the Design Process With the Purpose of Maintenance Optimization

by Lindquist, Tommie; Bertling, Lina; Eriksson, Roland

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 06A: Power System reliability. Moderator: James M. Loman, GE Energy...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Reliability-Availability-Maintainability

Fault Tree Analysis of Embedded Systems Using SystemC

by Zarandi, Hamid Reza; Miremadi, Seyed Ghassem

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 05D: Software Tools for R & M. Moderator: Liudong Xing, U. of Massachusetts...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Fault Tree Analysis

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