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A Maintenance Policy Optimized With Imperfect and / or Partial Monitoring

by Barros, A.; Grall, A.; Bérenguer, C.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 12C: Optimizing Equipment Maintenance. Moderator: Heather L. Nachtmann - University of Arkansas...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Optimizing Equipment Maintenance, Maintainability, Reliability Growth, Failure Rate

Simulation Model for Aircraft Line Maintenance Planning

by Gupta, Payal; Bazargan, Massoud; McGrath, Robert N.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 12C: Optimizing Equipment Maintenance. Moderator: Heather L. Nachtmann - University of Arkansas...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Optimizing Equipment Maintenance, Maintainability, Simulation

An Assessment of RPN Prioritization in a Failure Modes Effects and Criticality Analysis

by Bowles, John B.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 12B: FTA with Fault Tree Analysis. Moderator: James M. Wasiloff - Daimler Chrysler...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,FMEA,Fault Tree Analysis

A New Approach to Solve Dynamic Fault Trees

by Amari, Suprasad; Dill, Glenn; Howald, Eileen

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 12B: FTA with Fault Tree Analysis. Moderator: James M. Wasiloff - Daimler Chrysler...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

A Process for Failure Modes and Effects Analysis of Computer Software

by Ozarin, Nathaniel; Siracusa, Michael

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 12B: FTA with Fault Tree Analysis. Moderator: James M. Wasiloff - Daimler Chrysler...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,FMEA, Software Reliability, Fault Tree Analysis

Fuzzy Reliability in Conceptual Design

by Nachtmann, Heather; Chimka, Justin R.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11D: IIE - R&M Modeling and. Moderator: Robert J. Loomis - NASA...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,R&M Modeling and Optimization, Life Cycle Cost, Reliability Analysis/Prediction/Estimation, Simulation

Use of Nested Renewals to Model Availability Under Opportunistic Maintenance Policies

by Degbotse, Alfred T.; Nachlas, Joel A.

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11D: IIE - R&M Modeling and. Moderator: Robert J. Loomis - NASA...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,R&M Modeling and Optimization, Maintainability, Availability, Reliability Model

Performability Modeling and Decision Support for Computer Telephony Integration

by Rupe, Jason

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11D: IIE - R&M Modeling and. Moderator: Robert J. Loomis - NASA...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,R&M Modeling and Optimization, Reliability Model, Product Reliability, Process Reliability

Remaining Life Assessment of Aging Electronics in Avionic Applications

by Valentín, Ricky; Osterman, Michael; Newman, Bob

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11C: Aging. Moderator: Audrey Finot - Hewlett Packard...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Accelerated Life Test, Product Reliability, Failure Rate

Environmental Screening and Relevant Accelerated Tests for Products in an Outdoor Ground Environment

by Bhakta, Satish D.; Higgins, Sid

Annual Reliability and Maintainability Symposium (RAMS), 2003 Proceedings. Session 11C: Aging. Moderator: Audrey Finot - Hewlett Packard...

  • Filetype: pdf
  • Publish date: 2003-06
  • Keywords:RAMS 2003 Proceedings,Accelerated Life Test, Product Reliability

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