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Telcordia Reliability Prediction Procedure: Upper Confidence Levels

by Bennett, Jay M.

This paper will provide a brief overview of the RPP, review modifications to the procedure in Issue 2, and in particular describe the motivation for defining these new UCL.....

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Electronics, Reliability Analysis/Prediction/Estimation, Failure Rate

Electronics in Harsh Environments - Product Verification and Validation

by Stentoft, Kirsten; Petersen, Marie Louise

In this paper harsh environments are defined as a mix of contamination, aggressive gasses and high humidity. The effect of these impacts will increase by higher temperatures..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Electronics, HALT/HASS, Product Development Planning

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