Library

Effective Oversight

by Wasserman, Gary S.

The reliability group of a large defense contractor must report to management their progress in meeting Design for Reliability (DFR) objectives. Management is requesting metrics that they can use to track DFR milestones at each milestone in the phase.....

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Design Review

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Design/Reliability,RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Condition Diagnosis with Complex Network-Time Series Analysis

by Peilin Yang, PhD; Jianmin Gao, PhD; Jiacheng Pan, MS; Hongquan Jiang, PhD

Safety and reliability have always been the one of utmost and most important tasks, especially in chemical industry. The process industry system is a collection of many kinds of equipment, and it is usually of complex and integrated structures...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Process Design/Reliability

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Design/Reliability, RAMS 2011 Proceedings, Reliability Model

Planning a Reliability Growth Program Utilizing Historical Data

by Larry H. Crow, Ph.D

For many years prior to the Department of Def..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Birnbaum Importance in Solving Component Assignment Problems

by Xiaoyan Zhu, PhD; Way Kuo, PhD; Qingzhu Yao

As an important type of reliability optimization problems, the component assignment problem (CAP) is to find the optimal arrangement of n available components to n positions of a system such that the resulting system reliability is maximized...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Block Diagram, Reliability Model, Reliability Analysis/Prediction/Estimation, Design Reliability

Concurrent Engineering

by Dr Sam Keene;

Short history of Concurrent Engineering as part of the improvement process for reliability design..

  • Filetype: pdf
  • Publish date: 2010-09
  • Keywords:Design Reliability

Engineering Design Analysis (Physics of Failure)

by Drake, Gary S. ;

This article is an overview of AMSAA's techniques for analyzing the fatigue resistance of circuit card assemblies...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Design Reliability, Failure Analysis, FMEA

Probability of Failure of Safety-Critical Systems

by Bérenguer, Christophe ; Brissaud, Florent ; Barros, Anne ;

Formulas are proposed for availability assessment of k-out%2..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Failure Analysis, Product Reliability, Design Review, Reliability Model

Reliability Test Procedures for Achieving Highly Robust Electronic

by Tekcan, Tarkan ; Kirişken, Barbaros ;

© 2010 IEEE.Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

Today’s consumer electronics market becomes highly competitive because of the increase on number of manufacturers and high consumer expectations. These competition causes dramatic cost decreasing. Each cost down work could cause very crucial reliability problems if it is not managed well. Also, consumers’ expectations about reliability of the products are increased. Reliable, trouble-free and robust products satisfy customer needs for a long time. These quality improvements increase sales, reduce rework and services costs, and obtain good brand reputation. However, the manufacturing costs will be increased if it is wanted to produce highly

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Failure Analysis, Process Design/Reliability

ASQ News