Library

Parametric Degradation in Transistors

by Feinberg, Alec; Ersland, Peter; Widom, Allan; Kaper, Val

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Degradation

An Interval Estimate of Mean-Time-to-Failure for a Product With Reciprocal Weibull Degradation Failure Rate

by Polavarapu, Indira; Okogbaa, Geoffrey

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Product Reliability, Weibull Analysis, Degradation

Optimization of System Reliability Robustness Using Accelerated Degradation Testing

by Liao, Haitao; Elsayed, Elsayed A.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 05B: Product Design & Assurance. Moderator: Richard J. Rudy, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Robust Design, Degradation, Accelerated Life Test

ASQ News