Library

Data Collection and Reliability Analysis of Aged Electronic Devices

by Soto-Campos, E.; Marcos-Acevedo, J.; Fernández-Gómez, S.; Álvarez-Santos, R.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 09A: Accelerated Life Testing. Moderator: Vasiliy V. Krivtsov, Ford Motor Company...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Accelerated Life Test, Degradation

An Aging Hypothesis Test for Army Systems

by Nierwinski, John; Pollack, Douglas; Ankam, Rashmi

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 14A: Data Analysis Techniques for Fielded Systems. Moderator: Rick Searle, Air Force Operational Test and Evaluation Center...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Degradation, Design of Experiments

The Risks of Applying Qualitative Reliability Prediction Methods: A Case Study

by de Visser, Ilse M.; van den Bogaard, Johannes A.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 12E: Innovations in Failure and Fault Analysis. Moderator: Louis J. Gullo, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, FMEA, Degradation

Reliability Analysis of Aged Components

by Soto, E.; Marcos, J.; Villagrasa, S.; Fernández, S.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11A: Accelerated Life and Accelerated Reliability Growth Testing. Moderator: Hugh W. Broome, East Tennessee State University...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Accelerated Life Testing, Degradation

Fault Tolerance Adaptation Requirements vs. Quality-of-Service, Real-Time and Security in Dynamic Distributed Systems

by Tirtea, Rodica; Deconinck, Geert; Belmans, Ronnie

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 08E: Operational Reliability Requirements and Optimization. Moderator: Todd Heydt, GE Healthcare...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Redundancy, Degradation

Fatigue Analysis Framework for Fleet Management Using Bayesian Networks

by Rosqvist, Tony; Koski, Keijo; Siljander, Aslak

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Degradation

Predicting Remaining Useful Life of an Individual Unit Using Proportional Hazards Model and Logistic Regression Model

by Liao, Haitao; Zhao, Wenbiao; Guo, Huairui

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Risk Assessment, Degradation

Stochastic Petri Nets Modeling Using SPN@

by Volovoi, Vitali

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Availability, Maintainability, Degradation

Reliability Prediction Using Multivariate Degradation Data

by Xu, Di; Zhao, Wenbiao

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 09D: Warranty & Reliability. Moderator: Vasiliy V. Krivtsov, Ford Motor Company...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Analysis/Prediction/Estimation, Degradation

Reliability Prediction Through Degradation Data Modeling Using a Quasi-Likelihood Approach

by Jayaram, J. S. R.; Girish, T.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07D: R, M & Q in Design. Moderator: Alan P. Wood, Sun Microsystems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Degradation

ASQ News