Library

Reliability Modeling of Transistor Gates at the Nanoscale

by Otieno, Wilkistar; Okogbaa, O. Geoffrey

Our work is an attempt to examine the feasibility of porting what works in the macro realm to the nano realm and specifically the reliability of high-k dielectric material..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Model, Degradation, Electronic Reliability

Optimal Highway Maintenance Policies under Uncertainty

by Castanier, Bruno;Yeung, Thomas G.

We develop an inspection and maintenance policy to minimize the cost of maintaining a given section of road or highway when there is a great deal of uncertainty in the degradation process..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,R&M Modeling and Optimization, Markov, Degradation

Reliability Modeling for Dependent Competitive Failure Processes

by Wang, Zhong-Lai; Huang, Hong-Zhong

In this paper, a new system reliability model is proposed for systems that involve dependent and competitive degradations and shocks. This model will have wide application in many fields...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Degradation, Reliability Model, Markov

Reliability Evaluation of Systems with Degradation and Random Shocks

by Liu, Yu; Huang, Hong-Zhong; Pham, Hoang

This paper introduces a proposed model to evaluate the reliability of multi-component degradation systems suffering two kinds of competing failure causes: internal degradation process and damage from external random shocks..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Prediction, Reliability Model, Degradation, Monte Carlo Analysis

Uncertain Failure Thresholds in Cumulative Damage Models

by Usynin, Alexander; Hines, J. Wesley; Urmanov, Aleksey

This paper investigates the issues related to variability in degradation-based reliability models and how the variability affects the remaining useful life prognosis being made by those models...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Degradation, Reliability Model, Strength-Load

Maintenance policy for a non-stationary deteriorating system

by Deloux, Estelle; Castanier, Bruno; Berenguer, Christophe

This paper deals with the maintenance optimization of a system subject to a stressful environment...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Optimizing Equipment Maintenance, R&M Modeling and Optimization, Simulation, Degradation

Updating a User Friendly Combined Lifetime Failure Distribution

by Briand, Daniel; Campbell, James E.; Huzurbazar, Aparna V.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 11D: Modeling and Parameter Estimation. Moderator: Hugh Wilson Broome, East Tennessee State University...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Weibull Analysis, Degradation

Time to Failure Behavior Under a Stochastic Deterioration Model

by Xiang, Yisha; Cassady, C. Richard

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 13B: Fatigue and Degradation Modeling and Analysis for Reliability. Moderator: Wei Huang, Seagate Technology...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Degradation, Simulation

Reliability and Degradation Modeling With Random or Uncertain Failure Threshold

by Wang, Peng; Coit, David W.

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 13B: Fatigue and Degradation Modeling and Analysis for Reliability. Moderator: Wei Huang, Seagate Technology...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Degradation

Improved Reliability Using Accelerated Degradation & Design of Experiments

by Guo, Huairui; Mettas, Adamantios

Annual Reliability and Maintainability Symposium (RAMS), 2007 Proceedings. Session 14A: Data Analysis Techniques for Fielded Systems. Moderator: Rick Searle, Air Force Operational Test and Evaluation Center...

  • Filetype: pdf
  • Publish date: 2007-06
  • Keywords:RAMS 2007 Proceedings,Degradation, Design of Experiments

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