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Incorporating Expert Knowledge When Estimating Parameters of the Proportional Hazards Model

by Zuashkiani, Ali; Banjevic, Dragan; Jardine, Andrew K. S.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 11D: Advances in Risk Assessment. Moderator: Dr. Frank Sun, Western Digital...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis, Maintainability

Bayesian Estimation in Accelerated Life Testing Application on Exponential-Arrhenius Model

by Voiculescu, Sorin; Guerin, Fabrice; Charki, Abedrafi

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 09A: Accelerated Life Testing and Aging. Moderator: Adamantios Mettas, ReliaSoft...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis, Weibull Analysis

Bayesian Model for Early Reliability Prediction

by Ion, Roxana A.; Kalishoek, Hans; Karydas, Dimitrios M.; Nitescu, Iulian

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 08B: Innovative Planning Techniques for Reliability and Maintainability. Moderator: Dr. David W. Coit, Rutgers University...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis,

Modeling Low Probability/High Consequence Events: An Aviation Safety Risk Model

by Luxhøj, James T.; Coit, David W.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 07D: Meeting the Reliability Faculties. Moderator: Dr. Duane Dietrich, ReliaSoft...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis, Risk Assessment

A Comparison of Accelerated Life Testing Designs Within a Single Bayesian Inferential Framework

by Dorp, J. René van; Mazzuchi, Thomas A.; Garcidueñas, Jorge E.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 07D: Meeting the Reliability Faculties. Moderator: Dr. Duane Dietrich, ReliaSoft...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis, Accelerated Life Testing

Prior Specification for Multi-Failure Mode Weibull Reliability Models

by Groen, Frank J.; Droguett, Enrique López

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 07B: Practical Data Analysis, Emerging Tools and Techniques. Moderator: Harold E. Ascher, H. E. Ascher & Associates...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Bayesian Analysis, Weibull Analysis

Competing Failure Mode Modeling in a Bayesian Reliability Assessment Tool

by Brand, Michael; Brand, Daniel; Ben-Naphtali, Dan

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 13B: Risk & Safety Management. Moderator: Steven Smith, FAA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Bayesian Analysis, Weibull Analysis

Bayesian Accelerated Life Testing Under Competing Failure Modes

by Bunea, Cornel; Mazzuchi, Thomas A.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Accelerated Life Testing, Bayesian Analysis

Statistical Model for Estimating the Failure Probability in the Field

by Ion, Roxana

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08B: Modeling Long-Term Field Reliability. Moderator: Robert J. Loomis Jr., NASA...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Bayesian Analysis, Statistics

Bayesian Reliability Assessment of Gear Lifetime Under Fuzzy Environments

by Huang, Hong-Zhong; Sun, Zhan-Quan; Zuo, Ming J.; Tian, Zhi-Gang

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 08A: Component Reliability. Moderator: Kenneth P. LaSala, KPL Systems...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Bayesian Analysis, Reliability Model

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