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Concurrent Engineering

by Dr Sam Keene;

Short history of Concurrent Engineering as part of the improvement process for reliability design..

  • Filetype: pdf
  • Publish date: 2010-09
  • Keywords:Design Reliability

Engineering Design Analysis (Physics of Failure)

by Drake, Gary S. ;

This article is an overview of AMSAA's techniques for analyzing the fatigue resistance of circuit card assemblies...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Design Reliability, Failure Analysis, FMEA

Developmental Space-System Elicitation Techniques for Risk-Informed Design Practices

by Blake F. Putney; Benjamin J. Franzini;

This paper conveys a method of risk-informed design that is guided by system design documents and based on designer interaction. Designers focused on reliability strategies that were influenced and implemented by the designer’s own expertise...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Risk Assessment, Failure Analysis, Monte Carlo Analysis

Probability of Failure of Safety-Critical Systems

by Bérenguer, Christophe ; Brissaud, Florent ; Barros, Anne ;

Formulas are proposed for availability assessment of k-out%2..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Failure Analysis, Product Reliability, Design Review, Reliability Model

Reliability Test Procedures for Achieving Highly Robust Electronic

by Tekcan, Tarkan ; Kirişken, Barbaros ;

© 2010 IEEE.Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

Today’s consumer electronics market becomes highly competitive because of the increase on number of manufacturers and high consumer expectations. These competition causes dramatic cost decreasing. Each cost down work could cause very crucial reliability problems if it is not managed well. Also, consumers’ expectations about reliability of the products are increased. Reliable, trouble-free and robust products satisfy customer needs for a long time. These quality improvements increase sales, reduce rework and services costs, and obtain good brand reputation. However, the manufacturing costs will be increased if it is wanted to produce highly

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Accelerated Life Testing, Failure Analysis, Process Design/Reliability

Two Recommendations for the Acquisition and Growth of Reliable Systems

by Paul Lein; David B. Nicholls;

This paper presents recommendations for improving the acquisition of reliable systems: use a metric called Historical Observed Reliability Ratio and extend the classifications of failures to include Unanticipated Failure Mode and Unexpected Failure Mode...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Failure Analysis, Reliability Growth, Reliability Prediction

Enhancing MIL-HDBK-217 Reliability Predictions with Physics of Failure Methods

by James G. McLeish;

This paper reviews the concepts on how PoF methods can co-exist with empirical prediction techniques in MIL-HDBK-217...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Failure Analysis, Reliability and Availability Assessment, Reliability Prediction Design Reliability, Standards

Intermediate Failure States in Simulation-Based Launch Vehicle Risk Study

by Nejad,Hamed S.; Manning, Ted A.; Lawrence, Scott L.; Gee, Ken;

This paper concerns the risk assessment of a crewed launch vehicle on a mission to reach low earth orbit...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Product Reliability, Failure Analysis, Risk Assessment

Temperature Acceleration Models in Reliability Predictions: Justification

by Franck Bayle; Adamantios Mettas

We propose some improvements on steady-state temperature accleration models in order to have some more realistic reliability predictions...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Failure Analysis, Reliability Model

Accelerated Testing of Shaft Seals as Components with Complex Failure Modes

by Werner Haas; Daniel Kirschmann; Bernd Bertsche; Benjamin Klein;

In this paper the difficulties in accelerated life testing of RSS
are presented and..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, FMEA, Failure Analysis

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