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Fault Tree Analysis Using Stochastic Logic: A Reliable and High Speed Computing

by Zarandi, Hamid R.; Aliee, Hananeh

This paper introduces a new approach to analyzing fault trees based on stochastic logic...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

PRA As a Design Tool

by DeMott, D.L.

This paper explores the use of Probabilistic Risk Assessment (PRA) as a design tool early in the development process...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability

Reliability Analysis of Warm Standby Systems using Sequential BDD

by Xing, Liudong; Tannous, Ola; Dugan, Joanne Bechta

A sequential binary decision diagrams (SBDD) based approach is proposed for the reliability analysis of warm standby sparing systems. Basics of the proposed method and its advantages over existing approaches will be illustrated through several examples..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

A Systematic Fault Root Causes Tracing Method for Process Systems

by Jiang, Hongquan; Huang, Xinlin; Gao, Jianmin; Chen, Kun

This paper proposes a method to integrate a root causes tracing method with a Signed Diagraph (ADG) model for fault diagnosis and abnormal event management in the process industry...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis

Improvements In Estimating Software Reliability From Growth Test Data

by D’Onofrio, Paul; Dwyer, Dave

Line plotting for Musa’s Basic law can be improved by applying some lessons from E. O. Codier’s paper on hardware reliability growth plotting...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Software Reliability

Reliability Estimate of Mobile Agent System for QoS MANET Applications

by Neogy, Sarmistha; Chowdhury, Chandreyee

The present work proposes an algorithm for estimating task route reliability of Mobile Agent System for MANET applications with QoS requirement. The work considers Smooth Random Mobility Model and link failures while calculating reliability...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model

Warranty cost improvement of machine tools during the bidding process and operation

by Werner, Patrick; Lanza, Gisela; Behmann, Benjamin; Appel, Dominic

The paper shows a method to optimize warranty costs for reliability improvement warranties for machine tools in the bidding process and during operation..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Warranty

Achieving Reliability Goals for an EFV LRU through Laboratory Testing

by Pan, John; Loychik, Neil E.

Lessons learned with respect to the EFV’s HEU ALT program. Comparison of single axis ! and multi-axis controlled random vibration test techniques versus single axis and pneumatic repetitive shock...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Accelerated Life Testing, Product Reliability

Lithium Battery Analysis: Probability of Failure Assessment Using Logistic Regression

by Moebes, Travis A;

A Logistic Regression model was used to find helpful predictors for detecting “good” or “bad” cells in a large collection of lithium-ion battery cells...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability Analysis/Prediction/Estimation

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