Library

Modeling Fault Propagation in Phased Mission Systems using Petri

by Rasa Remenyte-Prescott, PhD; John D. Andrews, PhD

The research reported in the paper will describe a fault propagation modeling technique using Petri nets and its application to..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Condition Diagnosis with Complex Network-Time Series Analysis

by Peilin Yang, PhD; Jianmin Gao, PhD; Jiacheng Pan, MS; Hongquan Jiang, PhD

Safety and reliability have always been the one of utmost and most important tasks, especially in chemical industry. The process industry system is a collection of many kinds of equipment, and it is usually of complex and integrated structures...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Process Reliability

FaRBS: A New PoF Based VLSI Reliability Prediction Method

by Joseph B. Bernstein; Jin Qin; Hava Avshalom

It has long been a challenge for reliability engineers to provide accurate VLSI circuit reliability predictions. Decreasing feature sizes, coupled with non-ideal voltage scaling, raises new reliability concerns...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Pseudo-conjugated prior distribution for parametric ALT model

by Fabrice Guérin, Professor; Antoine Grall, Professor;

The study presents the construction of the prior distribution as a pseudo-conjugated form by simulation. The inte! rest of the procedure lays in the extended usage of the conjugate approach for multiple-parameter cases, as the ALT model...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Reliability Growth Test Design – Connecting Math to Physics

by Milena Krasich P. E

The paper describes a methodology for modeling reliability improvement test strategies to apply physics of failure and cumulative damage models with the related mathematics, and correlate tests to the product use in life...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Degradation test plan for Wiener degradation processes

by Paul Schimmerling; Mihaela Barreau-Guérin, Associate professor; Léo Gerville-Réache, Associate professor; Julien Baussaron, PhD student

The aim of this study is to design%! 20a degradation test plan that guarantees a given level of reliability for a new product using the experimental feedback...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Bayesian Planning of Optimal Step-Stress Accelerated Life Test

by Xi Liu; Tao Yuan, PhD

This study develops a method for planning optimal step-stress accelerated life test using the Bayesian approach...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Evaluating downtime and maintenance time in communication networks

by Matsukawa, Tatsuya; Koshiji, Kohjun; Funakoshi, Hiroyuki

In this paper a method for evaluating maintainability in communication networks is described...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Reliability

Fault Tree Analysis Using Stochastic Logic: A Reliable and High Speed Computing

by Zarandi, Hamid R.; Aliee, Hananeh

This paper introduces a new approach to analyzing fault trees based on stochastic logic...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis

Software Reliability Accelerated Testing Method Based on Test Coverage

by Wu, Yumei; Wang, Shuanqi; Lu, Minyan; Li, Haifeng

This paper proposes an accelerated testing method based on test coverage...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Accelerated Life Testing, Reliability Model, Software Reliability

ASQ News

Watch ASQ Weekly for updates!!     

 

 

WCQI
RAMS 2012