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Reliability Modeling Under the Constraint of Specified Maximum Acceptable Service Interruptions

by Langer, Yuri

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07B: Modeling & Simulation of Reliability Performance. Moderator: O. Geoffrey Okogbaa, U. of South Florida...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Markov

Analysis of Complex Repairable Systems

by Jacob, Daniel; Amari, Suprasad V.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07B: Modeling & Simulation of Reliability Performance. Moderator: O. Geoffrey Okogbaa, U. of South Florida...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Availability, Reliability Model

Modeling and Analysis of Repairable Systems With General Repair

by Mettas, Adamantios; Zhao, Wenbiao

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07B: Modeling & Simulation of Reliability Performance. Moderator: O. Geoffrey Okogbaa, U. of South Florida...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Availability, , Reliability Model, Weibull Analysis

Reliability Quantification of the Flexure: A Critical Stirling Convertor Component

by Shah, Ashwin R.; Korovaichuk, Igor; Zampino, Edward J.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07B: Modeling & Simulation of Reliability Performance. Moderator: O. Geoffrey Okogbaa, U. of South Florida...

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Risk Assessment, Reliability Model

UML Based Severity Analysis Methodology

by Hassan, A.; Goseva-Popstojanova, K.; Ammar, H.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Risk Assessment, Fault Tree Analysis, Safety

Bayesian Accelerated Life Testing Under Competing Failure Modes

by Bunea, Cornel; Mazzuchi, Thomas A.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Accelerated Life Testing, Bayesian Analysis

Reliability Analysis of Hierarchical Systems

by Chen, Guangyu; Huang, Xizi; Tang, Xiaowo

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Risk Assessment, Fault Tree Analysis, System Reliability

Aircraft Safety Modeling for Time-Limited Dispatch

by Prescott, Darren R.; Andrews, John D.

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Fault Tree Analysis, Markov, Monte Carlo Analysis

Developing High-Level Reliability Languages Using a General Intermediate Domain

by Painter, Robert R.; Coppit, David

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 07A: Effective Risk Assessment/Analysis. Moderator: Mary Rowzee, Daimler Chrysler Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Reliability Model, Fault Tree Analysis, Markov

Evaluating System Reliability From the Customer Perspective to Improve Availability Predictions

by Zhang, Xuemei; Sharma, Meenakshi; Franklin, Paul

Annual Reliability and Maintainability Symposium (RAMS), 2005 Proceedings. Session 06B: R & M Successes and Failures. Moderator: Pantelis Vassiliou, ReliaSoft Corp....

  • Filetype: pdf
  • Publish date: 2005-06
  • Keywords:RAMS 2005 Proceedings,Availability, Markov, Reliability Growth

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