Library

Stochastic Petri Nets Modeling Using SPN@

by Volovoi, Vitali

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Availability, Maintainability, Degradation

Current Knowledge About Nanotechnology Safety

by Datta, Koushik

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, Safety

Emerging Probabilistic Technology and Its Application to Reliability Prediction and Risk Assessment

by Khalessi, Mohammad R.; Lin, Hong-Zong; Kuper, Robert J.; D'Angelo, Antony

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, Simulation

Risk Assessment When Malevolent Actions Are Involved

by Bott, Terry F.; Eisenhawer, Stephen W.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05D: Humans in the Loop: Managing Risk via Assessment and Mitigation of Human Factors. Moderator: Joseph R. Fragola, SAIC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment

Cognitive Modeling of Underground Miners Response to Accidents

by Mohan, Surendra; Duarte, Dayse

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05D: Humans in the Loop: Managing Risk via Assessment and Mitigation of Human Factors. Moderator: Joseph R. Fragola, SAIC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Human Error, Reliability Model

Human Reliability Issues in Medical Care - a Customer Viewpoint

by Brall, Aron

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05D: Humans in the Loop: Managing Risk via Assessment and Mitigation of Human Factors. Moderator: Joseph R. Fragola, SAIC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Human Error

Customer Feedback Before Market Release: A Case Study

by Petkova, Valia T.; Sander, Peter C.; Lu, Yuan

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05D: Humans in the Loop: Managing Risk via Assessment and Mitigation of Human Factors. Moderator: Joseph R. Fragola, SAIC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Design Reliability, Warranty

Accessible Formal Verification for Safety-Critical Hardware Design

by Lach, John; Bingham, Scott; Elks, Carl; Lenhart, Travis; Nguyen, Thuy; Salaun, Patrick

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05A: Product Verification and Validation: When is Good, Good Enough?. Moderator: Ken Schmidt, Optim Associates...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Safety, Design Reliability

A Behavior-Based Process for Evaluating Availability Achievement Risk Using Stochastic Activity Networks

by Beaudet, Steven T.; Courtney, Tod; Sanders, William H.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05A: Product Verification and Validation: When is Good, Good Enough?. Moderator: Ken Schmidt, Optim Associates...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Availability, Networks, Reliability Model

Product Reliability Validation and Continuous Improvement Program at GE Energy

by Phillips, Randolph G.; Vittal, Sameer

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 05A: Product Verification and Validation: When is Good, Good Enough?. Moderator: Ken Schmidt, Optim Associates...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Product Reliability, Warranty, Reliability Growth

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