Library

Fatigue Analysis Framework for Fleet Management Using Bayesian Networks

by Rosqvist, Tony; Koski, Keijo; Siljander, Aslak

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Degradation

Predicting Remaining Useful Life of an Individual Unit Using Proportional Hazards Model and Logistic Regression Model

by Liao, Haitao; Zhao, Wenbiao; Guo, Huairui

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Risk Assessment, Degradation

Integrated Approach to Reliability-Based Design of Future Electronics Systems

by Nasser, Loren; Tryon, Robert; Rudy, Richard

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Electronic Reliability, Product Reliability

Actuarial Engineering Approaches for the Life Management of Power Plant Equipment

by Phillips, Randolph; Mango, Donald; Vittal, Sameer

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06E: New Product Life Analysis Techniques for Optimizing Operational Reliability. Moderator: Richard Rudy, VEXTEC...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Life Cycle Cost

Better Software Reliability by Getting the Requirements Right

by Bowles, John B.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06B: Software Reliability and Testing. Moderator: Dr. Liudong Xing, University of Massachusetts...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Software Reliability, Product Development Planning

Optimal Testing Resource Allocation Models for Modular Software

by Rajan, Rani; Misra, Ravindra B.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06B: Software Reliability and Testing. Moderator: Dr. Liudong Xing, University of Massachusetts...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Software Reliability, Product Reliability

Application of Statistical Testing to Smart Device Code

by Kuball, Silke; Gallardo, Julio; May, John

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06B: Software Reliability and Testing. Moderator: Dr. Liudong Xing, University of Massachusetts...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Software Reliability, Statistics

Resource Allocation Model for Software Module Testing

by Rajan, Rani; Misra, Ravindra B.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06B: Software Reliability and Testing. Moderator: Dr. Liudong Xing, University of Massachusetts...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Software Reliability, Failure Rate

Prediction Capabilities of Vulnerability Discovery Models

by Alhazmi, Omar H.; Malaiya, Yashwant K.

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Reliability Model, Software Reliability

Quantitative Risk Assessment for Dependent Vulnerabilities

by Sahinoglu, Mehmet

Annual Reliability and Maintainability Symposium (RAMS), 2006 Proceedings. Session 06A: Emerging Technologies and Trends. Moderator: Joseph A. Dzekevich, Raytheon Company...

  • Filetype: pdf
  • Publish date: 2006-06
  • Keywords:RAMS 2006 Proceedings,Risk Assessment, Reliability Model

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