Library

Optimal Design for Step-Stress Accelerated Degradation Testing Based on D-Optimality

by Zhengzheng Ge, PhD; Xiaoyang Li; Tongmin Jiang; Tingting Huang, PhD

Literatures about designing ADT were begin at the end of the last century. Research on CSADT is comparative mature than research on SSADT...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Accelerated Life Testing, Failure Rate, Product Reliability, RAMS 2011 Proceedings, , Reliability Analysis/Prediction/Estimation

Software Reliability Model with Bathtub-shaped Fault Detection Rate

by Swapna S. Gokhale, PhD; Lance Fiondella

Software does not wear out physically like hardware, which is directly subjected to mechanical and electrical stress through its lifetime. A thoroughly tested program should perform as required, assuming that its operating environment does not change...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model, Software Reliability

Planning a Reliability Growth Program Utilizing Historical Data

by Larry H. Crow, Ph.D

For many years prior to the Department of Def..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Model, Reliability Analysis/Prediction/Estimation

Special Topics for Consideration in a Design for Reliability Process

by Georgios Sarakakis; Athanasios Gerokostopoulos; Adamantios Mettas

In this paper, we look at certain areas of the Design For Reliability (DFR) process where missteps or misapplications are common due to misunderstood “common practices” ......

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Design Reliability, Conceptual Design, Failure Rate, Process Reliability, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation

Birnbaum Importance in Solving Component Assignment Problems

by Xiaoyan Zhu, PhD; Way Kuo, PhD; Qingzhu Yao

As an important type of reliability optimization problems, the component assignment problem (CAP) is to find the optimal arrangement of n available components to n positions of a system such that the resulting system reliability is maximized...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Block Diagram, Reliability Model, Reliability Analysis/Prediction/Estimation, Design Reliability

Hazard Analysis Based on Human-Machine-Environment Coupling

by Yang Wu, PhD; Xiaoyun Wang, PhD; Tingdi Zhao, PhD; Jin Tian, PhD;

The concept "Human (H)-Machine (M)-Environment (E) coupling" is put forward, and the connotative meaning and representation of the hazards owning to coupling is represented...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Conceptual Design, Design Reliability, Process Reliability, RAMS 2011 Proceedings, Reliability Model

Modeling Science Objectives within a Probabilistic Risk Assessment

by Smith, Clayton; Kubota, Sanae; Jones, Melissa; Fretz, Kristin

This paper discusses modeling aspects of the Radiation Belt Storm Probes (RBSP) science objectives..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings, Product Reliability, Reliability Model, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

by David E. Verbitsky, Ph. D;

Early failures (EFs), occurring during..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Analysis/ Physics of Failure, Product Reliability, RAMS 2011 Proceedings, Reliability Model

Mitigating Technical Risks by Creative Problem Solving Approaches

by Robert Schmitt, Prof. Dr.; Hans Gut, Prof. Dr.; Alexandra Ottong

The more intensive the competition, the more new strategies and methods have to be used to improve and renew processes. Companies must establish a risk management approach which helps to identify and assess risks as well as avoid non-conformities...

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:RAMS 2011 Proceedings

Soft Error Trends and Mitigation Techniques in Memory Devices

by Charles Slayman;

As various system technologies scale to larger device complexity and higher%2..

  • Filetype: pdf
  • Publish date: 2011-01
  • Keywords:Failure Rate, Product Reliability, RAMS 2011 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability Model

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