Library

Reliability Modeling of Transistor Gates at the Nanoscale

by Otieno, Wilkistar; Okogbaa, O. Geoffrey

Our work is an attempt to examine the feasibility of porting what works in the macro realm to the nano realm and specifically the reliability of high-k dielectric material..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Model, Degradation, Electronic Reliability

Software Reliability Modeling of Fault Detection and Correction Processes

by Shu, Yanjun; Wu, Zhibo; Liu, Honwei; Yang, Xianozong

In this paper, both fault detection and correction processes are considered in software reliability growth modeling...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Software Reliability, Reliability Growth, Reliability Model

Improving Reliability Studies With SysML

by David, Pierre; Idasiak, Vincent; Fratz, Frederic

In this paper, we introduce a methodology for the reliability analysis of complex systems during their design...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Design Reliability, FMEA, System Reliability, Reliability Model

Applying Software Failure Modes and Effects Analysis to Interfaces

by Ozarin, Nathaniel

Software failure modes and effects analysis (SFMEA) is sometimes applied to new mission-critical and safety-critical system development...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,FMEA, System Reliability, Software Reliability

Software Complexity and Testing Effectiveness: An Empirical Study

by Kevrekidis, Kostas; Albers, Stijn; Sonnemans, Peter J.M.; Stollman, Guillaume M.

This paper presents a simple method for evaluating the effectiveness of testing strategies by using the relation between software reliability and software complexity...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Software Reliability, Software Quality, Demonstration Tests

Bayesian Methods for Evaluating Discrete Reliability Growth

by Hall, J. Brian; Mosleh, Ali

Bayesian estimation procedures are derived herein that may be utilized to evaluate reliability growth of discrete systems, such as guns, rockets, missile systems, torpedoes, etc...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings, Bayesian Analysis, Reliability Growth

Reliability Analysis of k-out-of-n Load-Sharing Systems

by Amari, Supradad; Bergman, Robert

In this paper, we first discuss the modeling concepts of load-sharing systems and explain the role of accelerated life testing models in analyzing these systems...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Reliability Analysis/Prediction/Estimation, Strength-Load, Failure Rate

A Practical Method for Failure Analysis Using Incomplete Warranty Data

by Mohan, Karen; Cline, Brad; Akers, Jennifer

In this paper, we show that when the failure history information is incomplete, the failure distribution of the product can be determined using Bayesian analysis techniques applicable for handling incomplete data..

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings, Failure Analysis, Warranty, Bayesian Analysis

Reducing Corrosion Costs through Reliability Centered Design

by Rose, David H.

To ensure that potential cost reductions are maximized, the discipline employing these proposed tools must currently play an active role in product design and sustainment, and the tools must be integrated into currently accepted practices...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Design Reliability, Life Cycle Cost, Failure Analysis

Construction of Causality Diagram Model for Diagnostics

by Li, Guo; Gao, Jianmin; Chen, Fumin

In order to realize the computer-aided construction of the causality diagram for diagnostics, this paper proposes a simple, yet comprehensive representation model to organize the failure knowledge more systematically and completely...

  • Filetype: pdf
  • Publish date: 2008-02
  • Keywords:RAMS 2008 Proceedings,Failure Analysis, FMEA, Fault Tree Analysis

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