Library

Applying Discrete Event Modeling in the Real World

by Owens, James W.; Miller, Arthur S.; Deans, Daniel M.;

To be cost effective, reliability must be designed-in, and a reliability engineer must know how to ensure that reliability requirements are met up-front via consistent and focused design activity...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Product Reliability, Failure Rate, Maintainability

Feasibility of Provisioning Spares Using Reliability Software Programs

by Rich, Peter C. ; Mann, Reuben A. ;

This paper compares spares provisioning methods developed by the logistics community against methods developed by the reliability community...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,R&M Modeling and Optimization, Reliability Model

Optimal Design for Step-Stress Accelerated Degradation Testing with Competing Failure Modes

by Li, Xiaoyang; Jiang, Tongmin

This optimal testing plan gives the optimal number of test units and inspection times at each stress level. Finally, we analyze the different optimal plans with different budgets, different levels of stress and different stress steps..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Accelerated Life Testing, Degradation, FMEA, Fault Tree Analysis, Failure Rate

Analysis of Data to Predict Warranty Cost for Various Regions

by Vinta, Siva

This study shows that, how to take the complex failure information for different regions and break it down to main categories...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Warranty, Failure Rate, FMEA, Weibull

Six Challenges in Implementation of Effective Accelerated Life Tests

by Thiraviam, Amar; Mudge, Will; Malone, Linda

This paper presents the six primary challenges that need to be considered during the planning and implementation of ALT and shows through means of a case study, how inadequate planning of ALT can result in expensive field failures..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Failure Analysis, Accelerated Life Testing

Validation of a Mechanical Component Constant Failure Rate Database

by Bukowski, Julia V.; Goble, William M.

This paper reports on our successful efforts to validate statistically certain constant failure rate data in a mechanical component constant failure rate and failure mode database..

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Data Analysis, Degradation, Demonstration Tests, Failure Analysis

Advanced FTA Technique Addressing Early Un-Balanced Failures of Modern Commercial Electronic Devices

by Verbitsky, David E.

Specifics and criticality of unbalanced failures vs. full and parametric ones are outlined; typical examples related to diverse live applications are discussed. Failure dynamics and interactions are studied...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Failure Analysis, FMEA, Fault Tree Analysis

Reliability Analysis of Dynamic Fiber Bundle Models

by Amari, Suprasad V.; Pham, Hoang

Fiber bundle models are useful tools for explaining dynamic failure behavior in heterogeneous materials...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Weibull Analysis, System Reliability, Failure Analysis

A Parametric Reliability Prediction Tool for Space Applications

by Ogamba, Nkiru Udo

This paper demonstrates several analytical techniques used to predict units (from a group) that are more likely to fail in operation...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Reliability Model, Failure Analysis, Weibull Analysis, Bayesian Analysis

Effect of Solder Flux Residues on Corrosion of Electronics

by Stentoft, Kristen; Jellesen, Morten; Moller, Per; Westerman, Peter Jacob Schwenck

Flux from ‘No Clean’ solder processes can cause reliability problems in the field due to aggressive residues, which may be electrical conducting or corrosive in humid environments...

  • Filetype: pdf
  • Publish date: 2009-02
  • Keywords:RAMS 2009 Proceedings,Failure Analysis, Electronics

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