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Qualitative-Quantitative Bayesian Belief Networks for Reliability and Risk Assessment

by Chengdong Wang; Ali Mosleh;

This paper presents an extension of Bayesian belief
networks (BBN) enabling use of both qualitative and

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Bayesian, Risk Assessment, Root Cause Analysis

An Improved Monte Carlo Method in Fault Tree Analysis

by Yevkin, Olexandr , PhD;

The Monte Carlo (MC) method is one of the most general ones in system reliability analysis, because it reflects the statistical nature of the problem...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Fault Tree Analysis, Reliability Analysis/Prediction/Estimation

Using Risk Assessment to Mitigate New Business Demands

by Scapin, Carlos Alberto ; Gomes, Luciano de Alencar Miranda ;

Global market requires compliance with legal and regu..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Life Cycle Cost, Fault Tree Analysis

Using Electronic Design Automation Throughout The Product Life Cycle

by Mike Silverman; Bryan Stallard;

Several classes of ongoing analysis challenges regularly arise during production maturation of programs in military,aerospace, telecommunication, and medical areas...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Conceptual Design, Product Reliability, Software Reliability

Transcending Performability for System Attributes’ Consistency

by Yin, Meng-Lai ; Arellano, Rafael;

For complex systems where different perspectives need to be addressed, maintaining consistency among various system analyses is a challenge. A framework that supports a global view to govern various analyses is critical for integrity of system analyses...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Reliability Model, Requirements Flow Down

The Application of CREAM Based on HAZOP Analysis in Using Process of System

by Wei. Wang,; Tingdi. Zhao,;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists.....

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Fault Tree Analysis, Product Reliability, Product Development, Reliability Model, Software Reliability, Systems Engineering

Reliability Analysis of Missions with Cooperating Platforms

by Remenyte-Prescott, Rasa; Prescott, Darren R.; Andrews, John D.;

Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists......

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Design Reliability, Fault Tree Analysis, Product Development, Product Reliability, Reliability Analysis/Prediction/Estimation, Reliability Model, Systems Engineering

Physical Simulation in Space Launcher Engine Risk Assessment

by Ramamurthy, Balachandar; Horowitz, Eliyahu; Fragola, Joseph R.;

The safety and reliability of crewed launch vehicles are design driving criteria. The success of such vehicles is contingent on the ability to meet mission requirements, while keeping the risk to the crew at an acceptable level...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Product Reliability, Risk Assessment

Code of Practice

by Durand, Jacques J. Durand,; Cozzarin, Philippe;

Safety Critical Items List concept of our MIL-STD-882 standard has been..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Product Reliability, Requirements Flow Down, Maintainability

Value of Condition Monitoring Information

by Huynh, Tuan K. ; Castro, Inmaculada T. ; Bérenguer, Christophe ; Barros, Anne ;

This paper develops cost models for two ma!..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings, Reliability Analysis/Prediction/Estimation, Reliability

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