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Risk Assessment In Research Projects

by Roland Schmidt;

Failure Mode and Effect Analysis (FMEA) and Design
Review Based on Failure Mode (DRBFM) are discussed,
experiences are shared, and adapations are shown how FMEA and DRBFM can be a used in a creative and! structured way in research projects...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Design Review, FMEA, Risk Assessment

“Thinking Out of the Box” Strategy Resulted In Compliant FSS R

by Sheila S. Prather;

This paper will present how the R&M Integrated Product Team’s (IPT), thinking out of the box strategy resulted in upfront success and just as importantly provided a composite R&M dataset for future evaluations against actual performance metrics...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Reliability Enhancement, Reliability Management

Vehicle Wide Optimization of Subsystem Trade Study Option Selection

by Mattenberger,Chris

The Altair lunar lander design team was able toimplement a process of Risk Informed Design utilizing the Valador Reliability Tool in order to achieve high reliability...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Probabilistic Risk Assessment, Systems Engineering

Reliability Optimization of Multi-State Dependent-Independent Systems

by V. Ebrahimipour; S. Shokravi; M. Alen;

In this paper Particle Swarm Optimization method is used for optimization of reliability also the Universal Generating Function method is used for calculating the reliability of system...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,R&M Modeling and Optimization, Networks, Reliability Model

Design of Accelerated Life Testing Using Proportional Hazards-Proportional Odds

by Tongmin Jiang; Tingting Huang;

This paper presents an optimum design of constant stress accelerated life testing based on proportional hazardsproportional odds using penalized local D-optimality...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Weibull, Statistics

Reduced Bias Factor Distribution to Reduce the Likelihood Estimate Bias of Small Sample Sizes

by Moshe Felix Barmoav

A new method is developed by the author to reduce the bias of the maximum likelihood estimates (MLE) with small sample sizes. The new method is based on a special case of the Fréchet distribution...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Statistics, Weibull

Step-Stress ADT Data Estimation based on Time Series Method

by Xiaoyang Li; Tongmin Jiang; Li Wang; Bo Wan

Product performance degradation data of Step-Stress Accelerated Degradation Testing (SSADT) is time series. Hence, a time series method is proposed to analyses SSADT data...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Statistics, Demonstration Tests, Degradation, HALT/HASS

Accelerated Reliability Demonstration and Assurance Test Design

by Milena Krasich

This paper shows how fixed duration and reliability assurance tests can be accelerated to achieve two fold advantage: to determine product reliability as it is related to its actual use stresses and to shorten the test time...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Weibull, Statistics

Development of an Acceleration Model for Subsea Pressure

by Tom Foley; Linda Malone; Amar Thiraviam

This paper presents the steps followed in the development of an acceleration model for subsea pressure effects on plastic materials...

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Accelerated Life Testing, Engineering, Reliability Model

Software Reliability Accelerated Testing Method Based on Mixed Testing

by Yumei Wu, PhD; Yongqi Zhang, MD; Minyan Lu, PhD;

Software reliability accelerated testing based on
mixed testing and improved software reliability model based..

  • Filetype: pdf
  • Publish date: 2010-01
  • Keywords:RAMS 2010 Proceedings,Software Reliability, Accelerated Life Testing

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