Typical Super Early Degradation Failures of Mass-Produced Complex Electronics
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Physics of quasi-instantaneous prevalent failures of commercial devices are studied using systematic analytical methodology. Primary modes and mechanisms are revealed and classified, based on the interactions of gross-marginal features, faults and stresses. Highly accelerated degradation models and joint FTA-FMECA technique substantiate and interpret failure dynamics. Fixes dramatic improved quality and reduced losses of all product lines.
Keywords: Failure Analysis - Product Reliability - RAMS 2011 Proceedings - Reliability Model