ASQ - Electronics and Communications Division

Typical Super Early Degradation Failures of Mass-Produced Complex Electronics

Abstract: 2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

Physics of quasi-instantaneous prevalent failures of commercial devices are studied using systematic analytical methodology. Primary modes and mechanisms are revealed and classified, based on the interactions of gross-marginal features, faults and stresses. Highly accelerated degradation models and joint FTA-FMECA technique substantiate and interpret failure dynamics. Fixes dramatic improved quality and reduced losses of all product lines.

Keywords: Failure Analysis - Product Reliability - RAMS 2011 Proceedings - Reliability Model

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