ASQ - Electronics and Communications Division

FaRBS: A New PoF Based VLSI Reliability Prediction Method

Abstract: 2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

FaRBS (Failure Rate Based Simulation Program with Integrated Circuit Emphasis) is a new physics-of-failure based Very Large Scale Integration (VLSI) circuit reliability prediction method. With multiple failure mechanisms inherently modeled and analyzed, FaRBS will make reliability engineers’ life much easier by directly revealing each stress’s acceleration effect at system level, thus helping reliability engineers carry out system level VLSI reliability predictions and derating/uprating analyses. Based on Physics-of-Failure (PoF) models of intrinsic failure mechanisms, FaRBS takes a straightforward top-down, bottom-up approach to reduce both modeling and prediction complexity. Detailed application breakdown from the system level reveals bottom-level device's operation profile. Device- level reliability characterization provides accurate operation- based dynamic stress modeling by utilizing the physics-of- failure models. For each failure mechanism, the best-fit lifetime distribution is selected to provide the reliability prediction. With the bottom level device reliability prediction, the application-specific circuit and corresponding system reliability is further predicted by considering the system structure.

To demonstrate FaRBS and verify its prediction capability, reliability predictions were performed on a microcontroller, DRAM and microprocessor. The predicted failure rates were compared with field data (from 2002 to 2009) and demonstrate that the prediction agrees very well with the real failure rates.

Keywords: Failure Rate - Product Reliability - RAMS 2011 Proceedings - Reliability Analysis/Prediction/Estimation

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