ASQ - Electronics and Communications Division

Analyzing Interconnection Design Safety Using Bent Pin Analysis

Abstract: 2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

Low-tech hazards can cause catastrophic results in safety- critical and other systems. Designers sometimes fail to give adequate consideration to hazards in low-tech areas such as electrical interconnection designs, particularly when different design teams develop the subsystems on opposite ends of the interconnections. A good approach to addressing these hazards is a structured bent pin analysis that considers real- world conditions. This analysis can be applied to interconnection designs to adequately assess their failure modes and consequences. While much of the analysis can be automated to incorporate real-world conditions and produce accurate results, the human analyst must be aware that certain names or labels assigned by designers in their drawings may be misleading and present possible risks. The analyst must understand these risks when performing the analysis because they will affect its conclusions.

Keywords: Design Review - Design Reliability - Fault Tree Analysis - Product Reliability - RAMS 2011 Proceedings - Reliability Model - Systems Engineering

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