Optimized Acoustic Microscopy Screening for Multilayer Ceramic Capacitors

Abstract: © 2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

An optimized acoustic microscopy screening process has been developed for multi layer ceramic chip capacitors that identifies potential early life failures for removal. Accelerated life testing has validated the effectiveness of the methodology.

Keywords: RAMS 2011 Proceedings - Accelerated Life Testing - Failure Analysis - Product Reliability

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