ASQ - Electronics and Communications Division

Degradation test plan for Wiener degradation processes

Abstract: © 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

This study describes an approach to design degradation validation test plan using the Wiener process. This approach allows to link accelerated test results and field reliability without acceleration laws but using a global severity factor when the component to test is not an innovation and an old version is in field. In this condition, field data is available. The field degradation level can be measured and compared to degradation obtained in test. The test severity is evaluated with field and test degradation measurements. We use the same test severity to design a test plan for the new version of component. This test plan is designed to demonstrate a field reliability target with confidence level. The final test plan is obtained using experimental feedback, tests results and numerical simulations. This study shows the necessity to strengthen the test acceptance criterion when the test duration is reduced. This method allows to quantify this.

Keywords: RAMS 2011 Proceedings - Degradation - Reliability - Demonstration Tests

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