ASQ - Electronics and Communications Division

Degraded Systems with Multiple Performance Parameters

Abstract: 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE. The performance of a degraded system may contain multiple parameters, and each parameter degrades over time. When one of these parameters exceeds a certain threshold value because of degradation, the system will fail. Though extensive research on performance degradation analysis has been done, systems in these papers contain only one performance parameter and random shocks are not considered. The reliability of degraded systems with multiple performance parameters subject to random shocks is analyzed in this paper when the degradation processes of performance parameters are independent and dependent, respectively. In practice, the system performance and damages caused by random shocks must be not less than zero. The system reliability is estimated by Monte Carlo simulation when ranges of the system performance and damages caused by random shocks are taken into account. Eventually, a numerical example is illustrated to demonstrate the proposed method, and four different s! ituations are considered. Reliability is expressed by the probability that the item will perform its required function under given conditions for a stated time interval [1]. System reliability is usually analyzed according to failure data. However, it is difficult to get failure data when systems have extremely high reliability. Then the performance reliability was proposed to estimate the system reliability according to degradation data of the system performance. The performance of a degraded system degrades over time, when the performance exceeds a certain threshold value, the system will fail.

Keywords: RAMS 2010 Proceedings - Reliability Analysis/Prediction/Estimation - Reliability Model - Product Reliability

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