ASQ - Electronics and Communications Division

Integrated Risk Sensitivity Study for Lunar Surface Systems

Abstract: 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must first be obtained from the IEEE.

This paper illustrates an innovative approach to assessing the reliability of conceptual Lunar Surface Systems architectures using an integrated analysis model. The integrated model represents systems, dependencies, and interactions to develop risk-based reliability requirements that balance functional characteristics, needs, demands, and constraints to achieve availability goals. The model utilizes “availability” metrics based on first-order descriptions of the architecture to begin providing reliability impacts even before much design detail exists. Sensitivity analyses are performed to identify key risk parameters and find “knees” in the curve for establishment of system architecture- and element-level requirements.

Keywords: RAMS 2010 Proceedings - Product Reliability - Systems Engineering - Reliability Model

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