Optical Monitoring System Availability Optimization via Semi-Markov Processes and Genetic Algorithms

Annual Reliability and Maintainability Symposium - February 2008

Abstract: Annual RELIABILITY and MAINTAINABILITY Symposium 2008 PROCEEDINGS To cite the Proceedings as a reference: 2008 Proc. Ann. Reliability & Maintainability Symp. The Symposium does not copyright this Proceedings itself but uses one of its cosponsors (IEEE) to perform this service and associated administration. Copyright & Reprint Permission Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limit of US copyright law for the private use of patrons those articles in this Proceedings that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through: Copyright Clearance Center • 222 Rosewood Drive • Danvers, Massachusetts 01923 USA For other copying, reprint or reproduction permission, write to: IEEE Copyrights Manager IEEE Operations Center PO Box 1331 (445 Hoes Lane) Piscataway, New Jersey 08855-1331 USA Copyright © 2008 by the Institute of Electrical & Electronics Engineers, Inc. All rights reserved. Printed in the United States of America ISSN 0149-144X CD ROM ISBN: 1-4244-1461-X Library of Congress 78-132873 IEEE Catalog Number: 08CH37927C RAMS, RAMS.ORG and the RAMS logo are Registered Trademarks of the Symposium

Keywords: RAMS 2008 Proceedings - Reliability and Availability Assessment - Markov

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